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2015
Arrays of high quality SAM-based junctions and their application in molecular diode based logic, Wan, Albert, Sangeeth Suchand C. S., Wang Lejia, Yuan Li, Jiang Li, and Nijhuis Christian A. , Nanoscale, 10/2015, Volume 7, Number 46, p.19547–19556, (2015)
Defect Scaling with Contact Area in EGaIn-Based Junctions: Impact on Quality, Joule Heating, and Apparent Injection Current, Jiang, Li, Sangeeth Suchand C. S., Wan Albert, Vilan Ayelet, and Nijhuis Christian A. , Journal of Physical Chemistry C, 01/2015, Volume 119, Number 2, p.960–969, (2015)
One-Nanometer Thin Mono layers Remove the Deleterious Effect of Substrate Defects in Molecular Tunnel Junctions, Jiang, Li, Sangeeth Suchand C. S., Yuan Li, Thompson Damien, and Nijhuis Christian A. , Nano Letters, 10/2015, Volume 15, Number 10, p.6643–6649, (2015)
The Origin of the Odd-Even Effect in the Tunneling Rates across EGaln Junctions with Self-Assembled Monolayers (SAMs) of n-Alkanethiolates, Jiang, Li, Sangeeth Suchand C. S., and Nijhuis Christian A. , Journal of the American Chemical Society, 08/2015, Volume 137, Number 33, p.10659–10667, (2015)
Probing the nature and resistance of the molecule-electrode contact in SAM-based junctions, Sangeeth, Suchand C. S., Wan Albert, and Nijhuis Christian A. , Nanoscale, 06/2015, Volume 7, Number 28, p.12061–12067, (2015)
Tuning the Tunneling Rate and Dielectric Response of SAM-Based Junctions via a Single Polarizable Atom, Wang, Dandan, Fracasso Davide, Nurbawono Argo, Annadata Harshini V., Sangeeth Suchand C. S., Yuan Li, and Nijhuis Christian A. , Advanced Materials, 11/2015, Volume 27, Number 42, p.6689–+, (2015)

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