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The Origin of the Odd-Even Effect in the Tunneling Rates across EGaln Junctions with Self-Assembled Monolayers (SAMs) of n-Alkanethiolates

TitleThe Origin of the Odd-Even Effect in the Tunneling Rates across EGaln Junctions with Self-Assembled Monolayers (SAMs) of n-Alkanethiolates
Publication TypeJournal Article
AuthorsJiang, Li, Sangeeth Suchand C. S., and Nijhuis Christian A.

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