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Imaging local electronic properties of graphene

Speaker: 
Brian LeRoy (University of Arizona, USA)
Date: 
Fri, 19/04/2013 - 11:00am to 12:00pm
Location: 
S13-M01-11 (Physics Conference Room)
Event Type: 
Seminars

Abstract

Scanning probe microscopy is a powerful tool to probe low-dimensional systems. The local information provided by scanning probe microscopy is invaluable for studying effects such as interactions and scattering. Using this approach, we have probed the local electronic properties of graphene. We have studied the effect of charged impurities and the underlying substrate on the local density of states. We find that long‑range scattering from charged impurities locally shifts the charge neutrality point leading to electron and hole doped regions. By using boron nitride as a substrate, we observe an improvement in the electronic properties of the graphene as well as a moire pattern due to the misalignment of the graphene and boron nitride lattices. We find that the periodic potential due to the boron nitride substrate creates a set of 6 new superlattice Dirac points in graphene. More complicated graphene heterostructures can be created by adding additional layers of graphene or other two-dimensional materials. I will discuss our initial results in this direction.

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